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The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, pra
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has...
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Invaluable reference and guide for physicists, engineers and mathematicians
The wedding between Angela Gabriel and Brent Underwood promises to be the Birmingham event of the year--and aspiring event planner Melissa Anderson has been working feverishly to make it happen. During this hectic time, she even agrees to go out on a date with a most unlikely prospect: Marcus Peeples. When it came to Marcus, it definitely wasn't love at first sight. But after a lovely evening together of Bible study at Followers of Jesus Faith Worship Center, Melissa has a change of heart. She learns not only is Marcus a successful investor, but he's also a gifted minister. There's just one hitch: He's divorced--a fact Melissa can't reconcile with scripture even though she knows he's a good man and father. But when Marcus's diva ex-wife decides she wants him back, Melissa soon discovers love, divorce, and faith have quite a bit in common. . . Praise for Vanessa Davis Griggs and her novels. . . "This inspirational novel leaves the reader eager to know what Griggs plans next for this spiritual family." --Publishers Weekly on Blessed Trinity
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Invaluable reference and guide for physicists, engineers and mathematicians
First published in 1997. This monograph provides a complete overview of the coincidence site lattice model ad its application to grain boundary engineering. Originally propounded several decades ago, the coincidence site lattice (CSL) model has become a cornerstone of grain boundary structure research, particularly in cubic materials. The CSL model has the advantage of being used based on a simple geometrical concept which is easy to visualise and apply in practice. On the other hand here are limitations to the links between CSL geometry and boundary properties. However, with the advent of the new field of grain boundary engineering the CSL model has been shown to be useful and its is therefore timely to review the CSL model in this context.
Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors. The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics.
Publishes research papers in the mathematical and physical sciences. Continues: Proceedings of the Royal Society of London. Series A, Mathematical and physical sciences. Continued by: Proceedings. Mathematical, physical, and engineering sciences.
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