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VLSI Test Principles and Architectures
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Power-Aware Testing and Test Strategies for Low Power Devices
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design
With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-pu...
Advanced Circuits for Emerging Technologies
The book will address the-state-of-the-art in integrated circuit design in the context of emerging systems. New exciting opportunities in body area networks, wireless communications, data networking, and optical imaging are discussed. Emerging materials that can take system performance beyond standard CMOS, like Silicon on Insulator (SOI), Silicon Germanium (SiGe), and Indium Phosphide (InP) are explored. Three-dimensional (3-D) CMOS integration and co-integration with sensor technology are described as well. The book is a must for anyone serious about circuit design for future technologies. The book is written by top notch international experts in industry and academia. The intended audience is practicing engineers with integrated circuit background. The book will be also used as a recommended reading and supplementary material in graduate course curriculum. Intended audience is professionals working in the integrated circuit design field. Their job titles might be : design engineer, product manager, marketing manager, design team leader, etc. The book will be also used by graduate students. Many of the chapter authors are University Professors.
Machine Learning Support for Fault Diagnosis of System-on-Chip
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
Chinese Justice, the Fiction
This is a full-length study of Chinese crime fiction in all eras: ancient, modern, and contemporary. It is also the first book to apply legal scholars law and literature inquiry to the rich field of Chinese legal and literary culture.
Embedded Systems and Software Validation
Modern embedded systems require high performance, low cost and low power consumption. Such systems typically consist of a heterogeneous collection of processors, specialized memory subsystems, and partially programmable or fixed-function components. This heterogeneity, coupled with issues such as hardware/software partitioning, mapping, scheduling, etc., leads to a large number of design possibilities, making performance debugging and validation of such systems a difficult problem. Embedded systems are used to control safety critical applications such as flight control, automotive electronics and healthcare monitoring. Clearly, developing reliable software/systems for such applications is of...
Low-Power Design of Nanometer FPGAs
Low-Power Design of Nanometer FPGAs Architecture and EDA is an invaluable reference for researchers and practicing engineers concerned with power-efficient, FPGA design. State-of-the-art power reduction techniques for FPGAs will be described and compared. These techniques can be applied at the circuit, architecture, and electronic design automation levels to describe both the dynamic and leakage power sources and enable strategies for codesign. Low-power techniques presented at key FPGA design levels for circuits, architectures, and electronic design automation, form critical, "bridge" guidelines for codesign Comprehensive review of leakage-tolerant techniques empowers designers to minimize power dissipation Provides valuable tools for estimating power efficiency/savings of current, low-power FPGA design techniques
Quantum-Dot Cellular Automata Circuits for Nanocomputing Applications
This book provides a composite solution for optimal logic designs for Quantum-Dot Cellular Automata based circuits. It includes the basics of new logic functions and novel digital circuit designs, quantum computing with QCA, new trends in quantum and quantum-inspired algorithms and applications, and algorithms to support QCA designers. Futuristic Developments in Quantum-Dot Cellular Automata Circuits for Nanocomputing includes QCA-based new nanoelectronics architectures that help in improving the logic computation and information flow at physical implementation level. The book discusses design methodologies to obtain an optimal layout for some of the basic logic circuits considering key metr...
