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Mathematical Statistics With Applications
Mathematical statistics typically represents one of the most difficult challenges in statistics, particularly for those with more applied, rather than mathematical, interests and backgrounds. Most textbooks on the subject provide little or no review of the advanced calculus topics upon which much of mathematical statistics relies and furthermore contain material that is wholly theoretical, thus presenting even greater challenges to those interested in applying advanced statistics to a specific area. Mathematical Statistics with Applications presents the background concepts and builds the technical sophistication needed to move on to more advanced studies in multivariate analysis, decision th...
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Ordinary and Partial Differential Equations, 20th Edition
This well-acclaimed book, now in its twentieth edition, continues to offer an in-depth presentation of the fundamental concepts and their applications of ordinary and partial differential equations providing systematic solution techniques. The book provides step-by-step proofs of theorems to enhance students' problem-solving skill and includes plenty of carefully chosen solved examples to illustrate the concepts discussed.
The Properties of Ponderomotive Lenses
The Properties of Ponderomotive Lenses, Volume 228 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series
