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Over the last century, numerous optical techniques have been developed to characterize materials, giving insight into their optical, electronic, magnetic, and structural properties and elucidating such diverse phenomena as high-temperature superconductivity and protein folding. Optical Techniques for Solid-State Materials Characterization provides
Ultrafast Phenomena XIV presents the latest advances in ultrafast science, including ultrafast laser and measurement technology as well as studies of ultrafast phenomena. Pico-, femto-, and atosecond processes relevant in physics, chemistry, biology and engineering are presented. Ultrafast technology is now having a profound impact within a wide range of applications, among them imaging, material diagnostics, and transformation and high-speed optoelectronics. This book summarizes results presented at the 14th Ultrafast Phenomena Conference and reviews the state of the art in this important and rapidly advancing field.
An international team of experts describes the optical and electronic properties of semiconductors and semiconductor nanostructures at picosecond and femtosecond time scales. The contributions cover the latest research on a wide range of topics. In particular they include novel experimental techniques for studying and characterizing nanostructure materials. The contributions are written in a tutorial way so that not only researchers in the field but also researchers and graduate students outside the field can benefit.
This volume contains papers presented at the Eleventh International Conference on Ultrafast Phenomena held at Garmisch-Partenkirchen, Germany, from July 12 to 17, 1998. The biannual Ultrafast Phenomena Conferences provide a forum for dis cussion of the latest advances in ultrafast optics and their applications in science and engineering. The Garmisch conference brought together a multidisciplinary group of 440 participants from 27 countries, including 127 students. The enthu siasm of this large number of Participants, the high quality of the papers they presented and the magnificent conference site resulted in a successful and pleasant conference. Progress was reported in the technology of g...
The Frequency-Resolved Optical-Gating (FROG) technique has revolutionized our ability to measure and understand ultrashort laser pulses. This book contains everything you need to know to measure even the shortest, weakest, or most complex ultrashort laser pulses. Whether you're an undergrad or an advanced researcher, you'll find easy-to-understand descriptions of all the key ideas behind all the FROG techniques, all the practical details of pulse measurement, and many new directions of research. This book is not like any other scientific book. It is a lively discussion of the basic concepts. It is an advanced treatment of research-level issues.
Developments in lasers continue to enable progress in many areas such as eye surgery, the recording industry and dozens of others. This book presents citations from the book literature for the last 25 years and groups them for ease of access which is also provided by subject, author and titles indexes.
This book presents the latest advances in ultrafast science, including ultrafast laser and measurement technology, and studies of ultrafast phenomena. It summarizes the results presented at the 12th Ultrafast Phenomena Conference and reviews the state of the art of this important and rapidly advancing field.
MEMS and Nanotechnology, Volume 4 represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; Optical Measurements, Modeling and, Metrology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.