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Combined Analysis
  • Language: en
  • Pages: 382

Combined Analysis

This book introduces and details the key facets of Combined Analysis—an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The author starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Powder diffraction data treatment is introduced and in particular, the Rietveld analysis is discussed. The book also addresses automatic phase indexing—a necessary step to solve a structure ab initio. Since its effect prevails on real samples where textures are often stabiliz...

Materials Informatics
  • Language: en
  • Pages: 304

Materials Informatics

Provides everything readers need to know for applying the power of informatics to materials science There is a tremendous interest in materials informatics and application of data mining to materials science. This book is a one-stop guide to the latest advances in these emerging fields. Bridging the gap between materials science and informatics, it introduces readers to up-to-date data mining and machine learning methods. It also provides an overview of state-of-the-art software and tools. Case studies illustrate the power of materials informatics in guiding the experimental discovery of new materials. Materials Informatics: Methods, Tools and Applications is presented in two parts?Methodolo...

Modern Diffraction Methods
  • Language: en
  • Pages: 563

Modern Diffraction Methods

The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly, the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research. The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the book (either graduate students or mature scientists).

Multifunctional Polycrystalline Ferroelectric Materials
  • Language: en
  • Pages: 847

Multifunctional Polycrystalline Ferroelectric Materials

This book presents selected topics on processing and properties of ferroelectric materials that are currently the focus of attention in scientific and technical research. Ferro-piezoelectric ceramics are key materials in devices for many applications, such as automotive, healthcare and non-destructive testing. As they are polycrystalline, non-centrosymmetric materials, their piezoelectricity is induced by the so-called poling process. This is based on the principle of polarization reversal by the action of an electric field that characterizes the ferroelectric materials. This book was born with the aim of increasing the awareness of the multifunctionality of ferroelectric materials among dif...

Crystallography for Chemists
  • Language: en
  • Pages: 246

Crystallography for Chemists

For the last fifty years, X-ray crystallography and allied methods have been one of the most important analytical techniques for chemical analysis. With improved equipment, computers, and programs, the time required for such determinations has been reduced from months to hours. However, crystallography has never found its way into chemical education. There are many reasons for this failure, but the result has been most chemists having little understanding of the method beyond operating equipment and running black box programs. This book provides a basic education on crystallographic methods. As much as possible, it is non-mathematical, and written in language that chemists use. It is designed for the instruction of senior undergraduate students and beginning graduate students, but will also be of interest to any chemist who has had no instruction in crystallography. Much of the book provides information that can be used by chemists who do not plan to conduct crystallographic studies themselves.

12th INTERNATIONAL CERAMICS CONGRESS PART G
  • Language: en
  • Pages: 230

12th INTERNATIONAL CERAMICS CONGRESS PART G

Advances in Silicate Ceramics Selected papers from the 12 th International Ceramics Congress, part of CIMTEC 2010-12 th International Ceramics Congress and 5th Forum on New Materials, Montecatini Terme, Italy, June 6-11, 2010

Science
  • Language: en
  • Pages: 1644

Science

  • Type: Book
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  • Published: 2012
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  • Publisher: Unknown

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Thin Film Analysis by X-Ray Scattering
  • Language: en
  • Pages: 378

Thin Film Analysis by X-Ray Scattering

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials
  • Language: en
  • Pages: 320

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials

Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.

Dictionnaire historique et généalogique des familles du Poitou
  • Language: fr
  • Pages: 808

Dictionnaire historique et généalogique des familles du Poitou

  • Type: Book
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  • Published: 1895
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  • Publisher: Unknown

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