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Thermal Issues in Testing of Advanced Systems on Chip
Many cutting-edge computer and electronic products are powered by advanced Systems-on-Chip (SoC). Advanced SoCs encompass superb performance together with large number of functions. This is achieved by efficient integration of huge number of transistors. Such very large scale integration is enabled by a core-based design paradigm as well as deep-submicron and 3D-stacked-IC technologies. These technologies are susceptible to reliability and testing complications caused by thermal issues. Three crucial thermal issues related to temperature variations, temperature gradients, and temperature cycling are addressed in this thesis. Existing test scheduling techniques rely on temperature simulations...
Introduction to Advanced System-on-Chip Test Design and Optimization
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Embedded Systems Handbook
Embedded systems are nearly ubiquitous, and books on individual topics or components of embedded systems are equally abundant. Unfortunately, for those designers who thirst for knowledge of the big picture of embedded systems there is not a drop to drink. Until now. The Embedded Systems Handbook is an oasis of information, offering a mix of basic a
Advanced Computing and Systems for Security: Volume 13
This book features extended versions of selected papers that were presented and discussed at the 8th International Doctoral Symposium on Applied Computation and Security Systems (ACSS 2021), held in Kolkata, India, on April 9–10, 2021. Organized by the Departments of Computer Science & Engineering and A. K. Choudhury School of Information Technology at the University of Calcutta, the symposium’s international partners were Ca' Foscari University of Venice, Italy, and Bialystok University of Technology, Poland. The topics covered include biometrics, image processing, pattern recognition, algorithms, cloud computing, wireless sensor networks, and security systems, reflecting the various symposium sessions.
Algorithms in Ambient Intelligence
The advent of the digital era, the Internet, and the development of fast com puting devices that can access mass storage servers at high communication bandwidths have brought within our reach the world of ambient intelligent systems. These systems provide users with information, communication, and entertainment at any desired place and time. Since its introduction in 1998, the vision of Ambient Intelligence has attracted much attention within the re search community. Especially, the need for intelligence generated by smart al gorithms, which run on digital platforms that are integrated into consumer elec tronics devices, has strengthened the interest in Computational Intelligence. This newly developing research field, which can be positioned at the inter section of computer science, discrete mathematics, and artificial intelligence, contains a large variety of interesting topics including machine learning, con tent management, vision, speech, data mining, content augmentation, profiling, contextual awareness, feature extraction, resource management, security, and privacy.
System-on-Chip Test Architectures
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-sig...
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Handbook of 3D Integration, Volume 4
This fourth volume of the landmark handbook focuses on the design, testing, and thermal management of 3D-integrated circuits, both from a technological and materials science perspective. Edited and authored by key contributors from top research institutions and high-tech companies, the first part of the book provides an overview of the latest developments in 3D chip design, including challenges and opportunities. The second part focuses on the test methods used to assess the quality and reliability of the 3D-integrated circuits, while the third and final part deals with thermal management and advanced cooling technologies and their integration.
The Value of Supply Chain Visibility when Yield is Random
This book focuses on supply chains with uncertainty due to random yields. A common assumption in such systems is that the yields are observable only after all transportation or production steps are completed. The actual yield realization however happens earlier during the process. Technological advances and stronger supply chain collaboration make it possible to observe yield realization in real time and therefore close the time gap between the event and the observation. Within this thesis optimal and heuristic policies are developed that make use of this new type of information in various supply chain settings. These policies are used to identify conditions under which real time yield information is particularly beneficial. This book is relevant to both scholars and practitioners interested in managing supply chains with random yields.
Energy Efficient and Reliable Embedded Nanoscale SRAM Design
This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and rel...
