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Signal Integrity and Radiated Emission of High-Speed Digital Systems
Before putting digital systems for information technology or telecommunication applications on the market, an essential requirement is to perform tests in order to comply with the limits of radiated emission imposed by the standards. This book provides an investigation into signal integrity (SI) and electromagnetic interference (EMI) problems. Topics such as reflections, crosstalk, switching noise and radiated emission (RE) in high-speed digital systems are covered, which are essential for IT and telecoms applications. The highly important topic of modelling is covered which can reduce costs by enabling simulation data to demonstrate that a product meets design specifications and regulatory ...
Grounds for Grounding
GROUNDS FOR GROUNDING Gain a comprehensive understanding of all aspects of grounding theory and application in this new, expanded edition Grounding design and installation are crucial to ensure the safety and performance of any electrical or electronic system irrespective of size. Successful grounding design requires a thorough familiarity with theory combined with practical experience with real-world systems. Rarely taught in schools due to its complexity, identifying and implementing the appropriate solution to grounding problems is nevertheless a vital skill in the industrial world for any electrical engineer. In Grounds for Grounding, readers will discover a complete and thorough approac...
Handbook of Silicon Carbide Materials and Devices
This handbook presents the key properties of silicon carbide (SiC), the power semiconductor for the 21st century. It describes related technologies, reports the rapid developments and achievements in recent years, and discusses the remaining challenging issues in the field. The book consists of 15 chapters, beginning with a chapter by Professor W. J. Choyke, the leading authority in the field, and is divided into four sections. The topics include presolar SiC history, vapor-liquid-solid growth, spectroscopic investigations of 3C-SiC/Si, developments and challenges in the 21st century; CVD principles and techniques, homoepitaxy of 4H-SiC, cubic SiC grown on 4H-SiC, SiC thermal oxidation processes and MOS interface, Raman scattering, NIR luminescent studies, Mueller matrix ellipsometry, Raman microscopy and imaging, 4H-SiC UV photodiodes, radiation detectors, and short wavelength and synchrotron X-ray diffraction. This comprehensive work provides a strong contribution to the engineering, materials, and basic science knowledge of the 21st century, and will be of interest to material growers, designers, engineers, scientists, postgraduate students, and entrepreneurs.
Electromagnetic Compatibility in Railways
A railway is a complex distributed engineering system: the construction of a new railway or the modernisation of a existing one requires a deep understanding of the constitutive components and their interaction, inside the system itself and towards the outside world. The former covers the various subsystems (featuring a complex mix of high power sources, sensitive safety critical systems, intentional transmitters, etc.) and their interaction, including the specific functions and their relevance to safety. The latter represents all the additional possible external victims and sources of electromagnetic interaction. EMC thus starts from a comprehension of the emissions and immunity characteristics and the interactions between sources and victims, with a strong relationship to electromagnetics and to system modeling. On the other hand, the said functions are achieved and preserved and their relevance for safety is adequately handled, if the related requirements are well posed and managed throughout the process from the beginning. The link is represented by standards and their correct application, as a support to analysis, testing and demonstration.
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Compatibilidad Electromagnética y Seguridad Funcional en Sistemas Electrónicos
Todas las tecnologías electrónicas son vulnerables a errores y fallos de funcionalidad causados por interferencias electromagnéticas. Además, la sofisticación de la tecnología y el incremento en la densidad de integración, aumentan la susceptibilidad a las interferencias. Las fuentes de interferencia también han aumentado en los últimos años y la tendencia es a seguir haciéndolo tanto en número como en la intensidad de las señales interferentes. Estas fuentes de interferencia no sólo pueden ser externas al sistema, pueden provenir también de los propios circuitos electrónicos. Las emisiones, ya sean radiadas o conducidas, que se producen en los circuitos logran alcanzar otros...
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