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Low-Voltage CMOS Log Companding Analog Design
  • Language: en
  • Pages: 209

Low-Voltage CMOS Log Companding Analog Design

Low-Voltage CMOS Log Companding Analog Design presents in detail state-of-the-art analog circuit techniques for the very low-voltage and low-power design of systems-on-chip in CMOS technologies. The proposed strategy is mainly based on two bases: the Instantaneous Log Companding Theory, and the MOSFET operating in the subthreshold region. The former allows inner compression of the voltage dynamic-range for very low-voltage operation, while the latter is compatible with CMOS technologies and suitable for low-power circuits. The required background on the specific modeling of the MOS transistor for Companding is supplied at the beginning. Following this general approach, a complete set of CMOS...

Wireless Sensor Networks
  • Language: en
  • Pages: 360

Wireless Sensor Networks

  • Type: Book
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  • Published: 2003-08-26
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  • Publisher: CRC Press

Because they provide practical machine-to-machine communication at a very low cost, the popularity of wireless sensor networks is expected to skyrocket in the next few years, duplicating the recent explosion of wireless LANs. Wireless Sensor Networks: Architectures and Protocols describes how to build these networks, from the layers of the

DCIS2002
  • Language: en
  • Pages: 756

DCIS2002

Este libro contiene las presentaciones de la XVII Conferencia de Diseño de Circuitos y Sistemas Integrados celebrado en el Palacio de la Magdalena, Santander, en noviembre de 2002. Esta Conferencia ha alcanzado un alto nivel de calidad, como consecuencia de su tradición y madurez, que lo convierte en uno de los acontecimientos más importantes para los circuitos de microelectrónica y la comunidad de diseño de sistemas en el sur de Europa. Desde su origen tiene una gran contribución de Universidades españolas, aunque hoy los autores participan desde catorce países

ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis
  • Language: en
  • Pages: 666

ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis

The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

The British National Bibliography
  • Language: en
  • Pages: 1926

The British National Bibliography

  • Type: Book
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  • Published: 2003
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  • Publisher: Unknown

None

Proceedings
  • Language: en
  • Pages: 1306

Proceedings

  • Type: Book
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  • Published: 2004
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  • Publisher: Unknown

None

Conference Proceedings
  • Language: en
  • Pages: 834

Conference Proceedings

  • Type: Book
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  • Published: 2001
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  • Publisher: Unknown

None

IEEE International Symposium on Circuits and Systems
  • Language: en
  • Pages: 974

IEEE International Symposium on Circuits and Systems

These volumes relate to matters discussed during the 2003 IEEE International Symposium on Circuits and Systems, such as: analogue circuits and signal processing; communications; multimedia systems and applications; general and nonlinear circuits and systems; and neural networks and systems.

Proceedings of the ... International Conference on Microelectronics
  • Language: en
  • Pages: 442

Proceedings of the ... International Conference on Microelectronics

  • Type: Book
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  • Published: 2003
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  • Publisher: Unknown

None

IEEE Circuits & Devices
  • Language: en
  • Pages: 316

IEEE Circuits & Devices

  • Type: Book
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  • Published: 2005
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  • Publisher: Unknown

None