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Introduction to IDDQ Testing
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantl...
Proceedings
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Asian Test Symposium
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Digest of Papers
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Proceedings of the 8th International Conference on VLSI Design, January 4-7, 1995, New Delhi, India
Presents papers from the January 1995 conference. Topics include routing, hardware-software design/CAD, sequential automatic test pattern generation, logic synthesis, VLSI arithmetic, and chip design. Includes tools and technology poster sessions, and a panel discussion on India's role in the VLSI w
Principles of Testing Electronic Systems
A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines design...
