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Exploring Scanning Probe Microscopy with MATHEMATICA
This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample inter...
Modern Introduction to Surface Plasmons
Introducing graduate students in physics, optics, materials science and electrical engineering to surface plasmons, this book also covers guided modes at planar interfaces of metamaterials with negative refractive index. The physics of localized and propagating surface plasmons, on planar films, gratings, nanowires and nanoparticles, is developed using both analytical and numerical techniques. Guided modes at the interfaces between materials with any combination of positive or negative permittivity and permeability are analyzed in a systematic manner. Applications of surface plasmon physics are described, including near-field transducers in heat-assisted magnetic recording and biosensors. Resources at www.cambridge.org/9780521767170 include Mathematica code to generate figures from the book, color versions of many figures, and extended discussion of topics such as vector diffraction theory.
Modern Introduction to Surface Plasmons
"In 1952 Pines and Bohm discussed a quantized bulk plasma oscillation of electronsin a metallic solid to explain the energy losses of fast electrons passing throughmetal foils [1]. They called this excitation a "plasmon"--Provided by publisher.
Scanning Force Microscopy
Scanning tunneling microscopy (STM), invented by Binnig and Rohrer in 1982, enables one to obtain images reflecting surface electronic structure with atomic resolution. As an offshoot of this technology, Binnig, Quate and Gerber in 1986 invented atomic force microscopy (AFM), also capable of achieving atomic resolution. By now this technology proved to be an indispensable characterization tool with applications to surface physics and chemistry, material science, bio-science and data storage media, with promise in such areas as the semiconductor industry and optical quality control, for example. This book is the first attempt at organizing the whole rainbow of rapidly developing topics dealing with the mapping of a variety of forces across surfaces. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book a valuable source of up-to-date information.
Optics News
Includes a directory of members in one issue each year.
Exploring Scanning Probe Microscopy with Mathematica
This book/software edition provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. Its self-contained presentation spares researchers the valuable time spent hunting through the technical literature in search of prior theoretical results required to understand the models presented. Mathematica code for all examples is included both in the book and at the accompanying ftp site, affording the freedom to change, at will, the values and parameters of specific problems or even modify the programs themselves to suit various modeling needs. Exploring Scanning Probe Microsco...
President's Report
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Physics Briefs
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