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Modern Introduction to Surface Plasmons
This book introduces graduate students in physics, optics, materials science and electrical engineering to surface plasmons, and applications of surface plasmon physics.
Modern Introduction to Surface Plasmons
"In 1952 Pines and Bohm discussed a quantized bulk plasma oscillation of electronsin a metallic solid to explain the energy losses of fast electrons passing throughmetal foils [1]. They called this excitation a "plasmon"--Provided by publisher.
Modern Introduction to Surface Plasmons
Introducing graduate students in physics, optics, materials science and electrical engineering to surface plasmons, this book also covers guided modes at planar interfaces of metamaterials with negative refractive index. The physics of localized and propagating surface plasmons, on planar films, gratings, nanowires and nanoparticles, is developed using both analytical and numerical techniques. Guided modes at the interfaces between materials with any combination of positive or negative permittivity and permeability are analyzed in a systematic manner. Applications of surface plasmon physics are described, including near-field transducers in heat-assisted magnetic recording and biosensors. Resources at www.cambridge.org/9780521767170 include Mathematica code to generate figures from the book, color versions of many figures, and extended discussion of topics such as vector diffraction theory.
Surface Plasmons
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Seagate Technology Plc Patent Landscape Analysis – January 1, 1994 to December 31, 2013
The following analysis illustrates the underlying trends and relationships of U.S. issued patents of the subject company. The analysis employs two frequently used patent classification methods: US Patent Classification (UPC) and International Patent Classification (IPC). Aside from assisting patent examiners in determining the field of search for newly submitted patent applications, the two classification methods play a pivotal role in the characterization and analysis of technologies contained in collections of patent data. The analysis also includes the company’s most prolific inventors, top cited patents as well as foreign filings by technology area.
