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The phenomenal increases in computer system performance in recent years have been accompanied by a commensurate increase in power and energy dissipation. The latter has directly resulted in demand for expensive packaging and cooling technology, an increase in product cost, and a decrease in product reliability in all segments of the computing market. Moreover, the higher power/energy dissipation has signi cantly reduced battery life in portable systems. While - stem designers have traditionally relied on circuit-level techniques to reduce - wer/energy, there is a growing need to address power/energy dissipation at all levels of the computer system. We are pleased to welcome you to the procee...
The saturation of design complexity and clock frequencies for single-core processors has resulted in the emergence of multicore architectures as an alternative design paradigm. Nowadays, multicore/multithreaded computing systems are not only a de-facto standard for high-end applications, they are also gaining popularity in the field of embedded computing. The start of the multicore era has altered the concepts relating to almost all of the areas of computer architecture design, including core design, memory management, thread scheduling, application support, inter-processor communication, debugging, and power management. This book gives readers a holistic overview of the field and guides them to further avenues of research by covering the state of the art in this area. It includes contributions from industry as well as academia.
Markov Decision Processes (MDPs) are widely popular in Artificial Intelligence for modeling sequential decision-making scenarios with probabilistic dynamics. They are the framework of choice when designing an intelligent agent that needs to act for long periods of time in an environment where its actions could have uncertain outcomes. MDPs are actively researched in two related subareas of AI, probabilistic planning and reinforcement learning. Probabilistic planning assumes known models for the agent's goals and domain dynamics, and focuses on determining how the agent should behave to achieve its objectives. On the other hand, reinforcement learning additionally learns these models based on...
This book provides readers with a comprehensive, state-of-the-art overview of approximate computing, enabling the design trade-off of accuracy for achieving better power/performance efficiencies, through the simplification of underlying computing resources. The authors describe in detail various efforts to generate approximate hardware systems, while still providing an overview of support techniques at other computing layers. The book is organized by techniques for various hardware components, from basic building blocks to general circuits and systems.
Systems Self-Assembly is the only book to showcase state-of-the-art self-assembly systems that arise from the computational, biological, chemical, physical and engineering disciplines. Written by world experts in each area, it provides a coherent, integrated view of both book practice examples and new trends with a clearly presented computational flavor. The unifying thread throughout the text is the computational nature of self-assembling systems.This book consists of 13 chapters dealing with a variety of topics such as the patterns of self-organised nanoparticle assemblies; biomimetic design of dynamic self-assembling systems; computing by self-assembly involving DNA molecules, polyominoes...
Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
This book describes new, fuzzy logic-based mathematical apparatus, which enable readers to work with continuous variables, while implementing whole circuit simulations with speed, similar to gate-level simulators and accuracy, similar to circuit-level simulators. The author demonstrates newly developed principles of digital integrated circuit simulation and optimization that take into consideration various external and internal destabilizing factors, influencing the operation of digital ICs. The discussion includes factors including radiation, ambient temperature, electromagnetic fields, and climatic conditions, as well as non-ideality of interconnects and power rails.
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-sig...
Selected, peer reviewed papers from the 2010 IITA International Conference on Nanotechnology and Computer Engineering (CNCE 2010), held in Qingdao, China, July 20-21, 2010