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Microelectronic Systems
This book is dedicated to Prof. Dr. Heinz Gerhäuser on the occasion of his retirement both from the position of Executive Director of the Fraunhofer Institute for Integrated Circuits IIS and from the Endowed Chair of Information Technologies with a Focus on Communication Electronics (LIKE) at the Friedrich-Alexander-Universität Erlangen-Nürnberg. Heinz Gerhäuser's vision and entrepreneurial spirit have made the Fraunhofer IIS one of the most successful and renowned German research institutions. He has been Director of the Fraunhofer IIS since 1993, and under his leadership it has grown to become the largest of Germany's 60 Fraunhofer Institutes, a position it retains to this day, current...
Nondestructive Testing of Materials and Structures
Condition assessment and characterization of materials and structures by means of nondestructive testing (NDT) methods is a priority need around the world to meet the challenges associated with the durability, maintenance, rehabilitation, retrofitting, renewal and health monitoring of new and existing infrastructures including historic monuments. Numerous NDT methods that make use of certain components of the electromagnetic and acoustic spectrum are currently in use to this effect with various levels of success and there is an intensive worldwide research effort aimed at improving the existing methods and developing new ones. The knowledge and information compiled in this book captures the ...
2012
Particularly in the humanities and social sciences, festschrifts are a popular forum for discussion. The IJBF provides quick and easy general access to these important resources for scholars and students. The festschrifts are located in state and regional libraries and their bibliographic details are recorded. Since 1983, more than 659,000 articles from more than 30,500 festschrifts, published between 1977 and 2011, have been catalogued.
Future Security
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Machine Vision
The book offers a thorough introduction to machine vision. It is organized in two parts. The first part covers the image acquisition, which is the crucial component of most automated visual inspection systems. All important methods are described in great detail and are presented with a reasoned structure. The second part deals with the modeling and processing of image signals and pays particular regard to methods, which are relevant for automated visual inspection.
Works
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