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This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF). These interfaces are of a great fundamental and technological interest because they play an important role in the microstructural evolution and mechanical properties of Si3N4 ceramics used in many high temperature and pressure applications. The main contribution of this work is its detailed description of the bonding characteristics of light atoms, in particular oxygen and nitrogen, at these interfaces, which has not been achieved before. The atomic-scale information on the arrangement of both light and heavy atoms is critical for realistic modeling of interface properties, such as interface strength and ion transport, and will facilitate increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
The complex field of analytical chemistry requires knowledge and application of the fundamental principles of numerical calculation. Problems of Instrumental Analytical Chemistry provides support and guidance to help students develop these numerical strategies to generate information from experimental results in an efficient and reliable way. Exercises are provided to give standard protocols to follow which address the most common calculations needed in the daily work of a laboratory. Also included are easy to follow diagrams to facilitate understanding and avoid common errors, making it perfect as a hands-on accompaniment to in-class learning.Subjects covered follow a course in analytical chemistry from the initial basics of data analysis, to applications of mass, UV-Vis, infrared and atomic spectrometry, chromatography, and finally concludes with an overview of nuclear magnetic resonance. Intended as a self-training tool for undergraduates in chemistry, analytic chemistry and related subjects, this book is also useful as a reference for scientists looking to brush up on their knowledge of instrumental techniques in laboratories.
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Abstracts of dissertations available on microfilm or as xerographic reproductions.
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Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of ind...