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Oscillation-Based Test in Mixed-Signal Circuits
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
Low-Power High-Resolution Analog to Digital Converters
With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely e...
Low-Voltage CMOS Log Companding Analog Design
Low-Voltage CMOS Log Companding Analog Design presents in detail state-of-the-art analog circuit techniques for the very low-voltage and low-power design of systems-on-chip in CMOS technologies. The proposed strategy is mainly based on two bases: the Instantaneous Log Companding Theory, and the MOSFET operating in the subthreshold region. The former allows inner compression of the voltage dynamic-range for very low-voltage operation, while the latter is compatible with CMOS technologies and suitable for low-power circuits. The required background on the specific modeling of the MOS transistor for Companding is supplied at the beginning. Following this general approach, a complete set of CMOS...
Analogue-digital ASICs
For many applications, circuits that combine analog and digital signals can provide superior solutions to those produced with digital signals alone. Eighteen contributions in four sections--processing technology, circuit techniques and building blocks, design and applications, and CAD and supporting tools--detail and support this new approach. Annotation copyrighted by Book News, Inc., Portland, OR
Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
DCIS2002
Este libro contiene las presentaciones de la XVII Conferencia de Diseño de Circuitos y Sistemas Integrados celebrado en el Palacio de la Magdalena, Santander, en noviembre de 2002. Esta Conferencia ha alcanzado un alto nivel de calidad, como consecuencia de su tradición y madurez, que lo convierte en uno de los acontecimientos más importantes para los circuitos de microelectrónica y la comunidad de diseño de sistemas en el sur de Europa. Desde su origen tiene una gran contribución de Universidades españolas, aunque hoy los autores participan desde catorce países
New Developments in Biomedical Engineering
Biomedical Engineering is a highly interdisciplinary and well established discipline spanning across engineering, medicine and biology. A single definition of Biomedical Engineering is hardly unanimously accepted but it is often easier to identify what activities are included in it. This volume collects works on recent advances in Biomedical Engineering and provides a bird-view on a very broad field, ranging from purely theoretical frameworks to clinical applications and from diagnosis to treatment.
Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner u...
Switched-currents
Analogue designers from industry and academia worldwide have contributed to this first volume devoted entirely to switched-current analogue signal processing. The volume introduces the basic switched- current technique, reviews the state-of-the-art, and presents practical chip examples. Numerous application areas are described, ranging from filters and data converters to image processing applications. It also gives a comprehensive treatment of the fundamental principles of switched-current circuits and systems. For undergraduate and graduate students and practicing engineers in industry. Distributed by INSPEC. Annotation copyright by Book News, Inc., Portland, OR
Electrical Information and Mechatronics and Applications
Selected, peer reviewed papers from the 2011 International Conference on Electrical Information and Mechatronics, (ICEIM 2011), December 23-25, 2011, Jiaozuo, China
