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Dean, an extremely handsome and dangerous man, witnesses a deadly highway accident one night on his way home from work. Little does Dean know this accident is going to unleash a side of himself he never knew existed. A crumbling old manor house deep in the heart of rural Ireland contains a secret held by Dean and accomplices. In the middle of the ruin is a room. The Room will become home of four very bad men who Dean and his friends feel need to be taught a lesson.
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
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