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Crystallography of Quasicrystals
From tilings to quasicrystal structures and from surfaces to the n-dimensional approach, this book gives a full, self-contained in-depth description of the crystallography of quasicrystals. It aims not only at conveying the concepts and a precise picture of the structures of quasicrystals, but it also enables the interested reader to enter the field of quasicrystal structure analysis. Going beyond metallic quasicrystals, it also describes the new, dynamically growing field of photonic quasicrystals. The readership will be graduate students and researchers in crystallography, solid-state physics, materials science, solid- state chemistry and applied mathematics.
Reasoning in Boolean Networks
Reasoning in Boolean Networks provides a detailed treatment of recent research advances in algorithmic techniques for logic synthesis, test generation and formal verification of digital circuits. The book presents the central idea of approaching design automation problems for logic-level circuits by specific Boolean reasoning techniques. While Boolean reasoning techniques have been a central element of two-level circuit theory for many decades Reasoning in Boolean Networks describes a basic reasoning methodology for multi-level circuits. This leads to a unified view on two-level and multi-level logic synthesis. The presented reasoning techniques are applied to various CAD-problems to demonst...
Testability Concepts for Digital ICs
Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at P...
Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors h...
Beyond Quasicrystals
This book is the collection of most of the written versions of the Courses given at the Winter School "Beyond Quasicrystals" in Les Houches (March 7-18, 1994). The School gathered lecturers and participants from all over the world and was prepared in the spirit of a general effort to promote theoretical and experimental interdisciplinary communication between mathematicians, theoretical and experimental physicists on the topic of the nature of geometric order in solids beyond standard periodicity and quasi periodicity. The overall structure of the book reflects the wish of the editors to pose this fundamental question of geometric order in solids from both the experimental and theoretical point of view. The first part is devoted more specifically to quasicrystals. These materials were the common starting point of most of the audience and present a first concrete example of a non-trivial geometric order. We chose to focus on a few fundamental aspects of quasicrystals related to hidden symmetries in solids which are not easily found in standard textbooks on the topic, not to reach an exhaustive survey which is already available elsewhere.
The Boundary-Scan Handbook
Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily deal with. IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe thes...
Integrated Circuit Manufacturability
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the...
Aperiodic'97 - Proceedings Of The International Conference On Aperiodic Crystals
This book deals with various aspects of aperiodic crystals, quasicrystals, incommensurate crystals, composite crystals, modulated crystals and polytypes. It is mainly oriented towards crystallographic investigations and to the search for new theoretical and methodological methods aiming to model this state of matter and to understand the links between the structure and the properties. Basically multidisciplinary, the book covers many fields of aperiodic crystals, from materials science to mathematics.
From Contamination to Defects, Faults and Yield Loss
Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufa...
Theories of Matter
This volume contains a selection of articles on modern theoretical physics contributed by leading scientists. It is dedicated to Joseph L Birman for his prolific and outstanding contribution to the field. The topics covered are in the fields of condensed matter and solid state physics, elementary particles and quantum optics.
