Welcome to our book review site go-pdf.online!
You may have to Search all our reviewed books and magazines, click the sign up button below to create a free account.
A Practical Introduction to PSL
This book describes the Property Specification Language PSL, recently standardized as IEEE Standard 1850-2005. PSL was developed to fulfill the following requirements: easy to learn, write, and read; concise syntax; rigorously well-defined formal semantics; expressive power, permitting the specification for a large class of real world design properties; known efficient underlying algorithms in simulation, as well as formal verification. Basic features are covered, as well as advanced topics such as the use of PSL in multiply-clocked designs. A full chapter is devoted to common errors, gathered through the authors' many years of experience in using and teaching the language.
Wafer Level 3-D ICs Process Technology
This book focuses on foundry-based process technology that enables the fabrication of 3-D ICs. The core of the book discusses the technology platform for pre-packaging wafer lever 3-D ICs. However, this book does not include a detailed discussion of 3-D ICs design and 3-D packaging. This is an edited book based on chapters contributed by various experts in the field of wafer-level 3-D ICs process technology. They are from academia, research labs and industry.
Self-Destruction of Complex Systems
This book is the first attempt to provide a general theory of self-destruction in complex systems applicable to natural, social and cultural phenomena. The contributors work collaboratively to prove that many of the nondistributed complex systems in nature and society sooner or later experience critical development leading to unintended and irreversible self-annihilation. The individual chapters also show that the relations of such systems to their own distinctiveness and other systems may result in specific communicative pathologies (such as redundancy, inflation and noisy signalling) which tend to mitigate or reinforce each other, depending on circumstances. Finally, the volume updates som...
Ultra-Low Voltage Nano-Scale Memories
Ultra-low voltage large-scale integrated circuits (LSIs) in nano-scale technologies are needed both to meet the needs of a rapidly growing mobile cell phone market and to offset a significant increase in the power dissipation of high-end microprocessor units. The goal of this book is to provide a detailed explanation of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are systematically discussed in terms of reliable high-speed operations of memory cells and peripheral logic circuits. The effectiveness of solutions at device and circuit levels is also described at length through clarifying noise components in an array, and even essential differences in ultra-low voltage operations between DRAMs and SRAMs.
High-Performance Energy-Efficient Microprocessor Design
Written by the world’s most prominent microprocessor design leaders from industry and academia, this book provides complete coverage of all aspects of complex microprocessor design: technology, power management, clocking, high-performance architecture, design methodologies, memory and I/O design, computer aided design, testing and design for testability. The chapters provide state-of-the-art knowledge while including sufficient tutorial material to bring non-experts up to speed. A useful companion to design engineers working in related areas.
Analog Circuit Design
Johan H. Huijsing This book contains 18 tutorial papers concentrated on 3 topics, each topic being covered by 6 papers. The topics are: Low-Noise, Low-Power, Low-Voltage Mixed-Mode Design with CAD Tools Voltage, Current, and Time References The papers of this book were written by top experts in the field, currently working at leading European and American universities and companies. These papers are the reviewed versions of the papers presented at the Workshop on Advances in Analog Circuit Design. which was held in Villach, Austria, 26-28 April 1995. The chairman of the Workshop was Dr. Franz Dielacher from Siemens, Austria. The program committee existed of Johan H. Huijsing from the Delft U...
Modern Circuit Placement
This book covers advanced techniques in modern circuit placement. It details all of most recent placement techniques available in the field and analyzes the optimality of these techniques. Coverage includes all the academic placement tools that competed against one another on the same industrial benchmark circuits at the International Symposium on Physical Design (ISPD), these techniques are also extensively being used in industrial tools as well. The book provides significant amounts of analysis on each technique such as trade-offs between quality-of-results (QoR) and runtime.
CMOS Electronics
CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, thi...
SAT-Based Scalable Formal Verification Solutions
This book provides an engineering insight into how to provide a scalable and robust verification solution with ever increasing design complexity and sizes. It describes SAT-based model checking approaches and gives engineering details on what makes model checking practical. The book brings together the various SAT-based scalable emerging technologies and techniques covered can be synergistically combined into a scalable solution.
Introduction to IDDQ Testing
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantl...
