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Jitter, Noise, and Signal Integrity at High-Speed
State-of-the-art JNB and SI Problem-Solving: Theory, Analysis, Methods, and Applications Jitter, noise, and bit error (JNB) and signal integrity (SI) have become today‘s greatest challenges in high-speed digital design. Now, there’s a comprehensive and up-to-date guide to overcoming these challenges, direct from Dr. Mike Peng Li, cochair of the PCI Express jitter standard committee. One of the field’s most respected experts, Li has brought together the latest theory, analysis, methods, and practical applications, demonstrating how to solve difficult JNB and SI problems in both link components and complete systems. Li introduces the fundamental terminology, definitions, and concepts associated with JNB and SI, as well as their sources and root causes. He guides readers from basic math, statistics, circuit and system models all the way through final applications. Emphasizing clock and serial data communications applications, he covers JNB and SI simulation, modeling, diagnostics, debugging, compliance testing, and much more.
VLSI Test Principles and Architectures
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
High Speed Serdes Devices and Applications
The simplest method of transferring data through the inputs or outputs of a silicon chip is to directly connect each bit of the datapath from one chip to the next chip. Once upon a time this was an acceptable approach. However, one aspect (and perhaps the only aspect) of chip design which has not changed during the career of the authors is Moore’s Law, which has dictated substantial increases in the number of circuits that can be manufactured on a chip. The pin densities of chip packaging technologies have not increased at the same pace as has silicon density, and this has led to a prevalence of High Speed Serdes (HSS) devices as an inherent part of almost any chip design. HSS devices are ...
Design and Test for Multiple Gbps Communication Devices and Systems
Focuses on the multiple Gbps communication technologies and applications - from design to test - and covers the useful elements of device and system development (architecture, simulation and modeling, design techniques, and testing). This title helps you to choose the right methods and tools for your designs and tests.
Power Distribution Network Design Methodologies
A series of cogently written articles by 49 industry experts, this collection fills the void on Power Distribution Network (PDN) design procedures, and addresses such related topics as DC–DC converters, selection of bypass capacitors, DDR2 memory systems, powering of FPGAs, and synthesis of impedance profiles. Through these contributions from such leading companies as Sun Microsystems, Sanyo, IBM, Hewlett-Packard, Intel, and Rambus, readers will come to understand why books on power integrity are only now becoming available to the public and can relate these topics to current industry trends.
System-on-Chip Test Architectures
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-sig...
Signal and Power Integrity - Simplified
The #1 Practical Guide to Signal Integrity Design—Now Updated with Extensive New Coverage! This book brings together up-to-the-minute techniques for finding, fixing, and avoiding signal integrity problems in your design. Drawing on his work teaching more than five thousand engineers, world-class signal and power integrity expert Eric Bogatin systematically reviews the root causes of all six families of signal integrity problems and shows how to design them out early in the design cycle. This edition’s extensive new content includes a brand-new chapter on S-parameters in signal integrity applications, and another on power integrity and power distribution network design—topics at the for...
Power Integrity Modeling and Design for Semiconductors and Systems
The First Comprehensive, Example-Rich Guide to Power Integrity Modeling Professionals such as signal integrity engineers, package designers, and system architects need to thoroughly understand signal and power integrity issues in order to successfully design packages and boards for high speed systems. Now, for the first time, there's a complete guide to power integrity modeling: everything you need to know, from the basics through the state of the art. Using realistic case studies and downloadable software examples, two leading experts demonstrate today's best techniques for designing and modeling interconnects to efficiently distribute power and minimize noise. The authors carefully introdu...
Modern VLSI Design
The Number 1 VLSI Design Guide—Now Fully Updated for IP-Based Design and the Newest Technologies Modern VLSI Design, Fourth Edition, offers authoritative, up-to-the-minute guidance for the entire VLSI design process—from architecture and logic design through layout and packaging. Wayne Wolf has systematically updated his award-winning book for today’s newest technologies and highest-value design techniques. Wolf introduces powerful new IP-based design techniques at all three levels: gates, subsystems, and architecture. He presents deeper coverage of logic design fundamentals, clocking and timing, and much more. No other VLSI guide presents as much up-to-date information for maximizing performance, minimizing power utilization, and achieving rapid design turnarounds.
Public Service Performance and Political Elite Career Advancement
Public performance-accountability nexus is a hot topic in recent research, but we know little about its antecedents and consequences in developing countries and transition economies. Are top-down appointed political elites taken accountable for public service performance in authoritarian nations like China? The question is theoretically and empirically examined in the book. I argue that government cadres are appropriately appraised and promoted even with the lame democracy. Using a novel dataset and event history analysis method, I test the performance-based political promotion tournament theory and its contingent features. I find that career advancement of provincial leading officials is positively influenced by public service performance but not by economic performance. The effect is stronger for Party secretaries than governors, for central connected officials than local officials, for younger than older, and for short tenure in office than long serving. The performance-promotion nexus in relatively weak and contingent on contextual attributes, suggesting performance-based reform should be deepened to make local agents accountable for public service delivery and responsiveness.
