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Morocco
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Tunisia
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Fast Transforms Algorithms, Analyses, Applications
This book has grown from notes used by the authors to instruct fast transform classes. One class was sponsored by the Training Department of Rockwell International, and another was sponsored by the Department of Electrical Engineering of The University of Texas at Arlington. Some of the material was also used in a short course sponsored by the University of Southern California. The authors are indebted to their students for motivating the writing of this book and for suggestions to improve it.
Sahara and Sudan
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Index Medicus
Vols. for 1963- include as pt. 2 of the Jan. issue: Medical subject headings.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in...
