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Fundamentals of Solid-state Electronics
  • Language: en
  • Pages: 216

Fundamentals of Solid-state Electronics

This Solution Manual, a companion volume of the book, Fundamentals of Solid-State Electronics, provides the solutions to selected problems listed in the book. Most of the solutions are for the selected problems that had been assigned to the engineering undergraduate students who were taking an introductory device core course using this book.This Solution Manual also contains an extensive appendix which illustrates the application of the fundamentals to solutions of state-of-the-art transistor reliability problems which have been taught to advanced undergraduate and graduate students.

Strain Effect in Semiconductors
  • Language: en
  • Pages: 353

Strain Effect in Semiconductors

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

The chronic challenge - new vistas on long-term multisite contacts to the central nervous system
  • Language: en
  • Pages: 162

The chronic challenge - new vistas on long-term multisite contacts to the central nervous system

Have you ever heard of a Hype-Cycle? It is a description that was put forward by an IT consultancy firm to describe certain phenomena that happen within the life cycle of new technology products. As Fenn and Raskino stated in their book (Fenn and Raskino 2008), a novel technology - a “Technology Trigger” - gives rise to a steep increase in interest, leading to the “Peak of Inflated Expectations”. Following an accumulation of more detailed knowledge on the technology and its short-comings, the stake holders may need to traverse a “Trough of Disillusionment”, which is followed by a shallower “Slope of Enlightenment”, before finally reaching the “Plateau of Productivity”. In...

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
  • Language: en
  • Pages: 618

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation en...

Noise in Physical Systems and 1/f Fluctuations
  • Language: en
  • Pages: 850

Noise in Physical Systems and 1/f Fluctuations

The International Conference on Noise in Physical Systems and 1/f Fluctuations brings together physicists and engineers interested in all aspects of noise and fluctuations in materials, devices, circuits, and physical and biological systems. The experimental research on novel devices and systems and the theoretical studies included in this volume provide the reader with a comprehensive, in-depth treatment of present noise research activities worldwide.

Noise In Physical Systems And 1/f Fluctuations: Icnf 2001, Procs Of The 16th Intl Conf
  • Language: en
  • Pages: 850

Noise In Physical Systems And 1/f Fluctuations: Icnf 2001, Procs Of The 16th Intl Conf

The International Conference on Noise in Physical Systems and 1/f Fluctuations brings together physicists and engineers interested in all aspects of noise and fluctuations in materials, devices, circuits, and physical and biological systems. The experimental research on novel devices and systems and the theoretical studies included in this volume provide the reader with a comprehensive, in-depth treatment of present noise research activities worldwide.

Official Gazette of the United States Patent and Trademark Office
  • Language: en
  • Pages: 2998

Official Gazette of the United States Patent and Trademark Office

  • Type: Book
  • -
  • Published: 1977
  • -
  • Publisher: Unknown

None

Official Gazette of the United States Patent and Trademark Office
  • Language: en
  • Pages: 1398

Official Gazette of the United States Patent and Trademark Office

  • Type: Book
  • -
  • Published: 2002
  • -
  • Publisher: Unknown

None

Index of Patents Issued from the United States Patent Office
  • Language: en
  • Pages: 2124

Index of Patents Issued from the United States Patent Office

  • Type: Book
  • -
  • Published: 1977
  • -
  • Publisher: Unknown

None

Fundamentals of Solid-State Electronics — Study Guide
  • Language: en
  • Pages: 452

Fundamentals of Solid-State Electronics — Study Guide

This companion to Fundamentals of Solid-State Electronics provides a helpful summary of the main text for students and lecturers alike. The clear typeface, large font, and point form layout, are designed to produce viewgraphs for lectures and to provide ample margins for study notes. This Study Guide comes complete with a detailed description of two one-semester solid-state electronics core courses, taught to about 80–100 sophomore-junior students each time, four years apart. It links the contents of the one-semester lecture course to the textbook. This book is also available as a set with Fundamentals of Solid-State Electronics and Fundamentals of Solid-State Electronics — Solution Manual. Sample Chapter(s) Introduction to this Course (116k) Chapter 1: Electrons, Bonds, Bands, Holes (565k) Request Inspection Copy