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ToF-SIMS
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Polymer Surfaces and Interfaces
In what is an extremely practical and applicable new work, experts provide concise explanations, with examples and illustrations, of the key techniques in this important field. In each case, after basic principles have been reviewed, applications of the experimental techniques are discussed and illustrated with specific examples. Scientists and engineers in research and development will benefit from an application-oriented book that helps them to find solutions to both fundamental and applied problems. They will know that the surfaces and interfaces of polymers play an important role in most of the application areas of polymers, from moulds, foils, and composites, to biomaterials and applications in micro- and nanotechnology.
Secondary Ion Mass Spectrometry
Hardbound. This biennial conference series is the first international forum covering developments in Secondary Ion Mass Spectrometry. All aspects of the most recent developments in SIMS were covered by the scientific program: fundamentals, instrumentation, methodology, and analytical applications in different fields (semiconductors, polymer and organic materials, life sciences, environmental sciences, earth sciences, materials science). Related techniques and topics were also included.
Ion Formation from Organic Solids (IFOS IV)
Contains 23 of the 42 papers presented at the Fourth International Conference on Ion Formation from Organic Solids, held at the University of Münster, in September of 1987. These contributions reflect recent progress in ion desorption by keV-particle bombardment, ion desorption by MeV-particle bombardment, ion desorption by laser irradiation, and positionization of neutrals. Fundamental aspects, instrumentation, and analytical applications are all considered.
Progress in Materials Analysis
The 11th Colloquium on Metallurgical Analysis - a joint venture of the Institute of Analytical Chemistry of the Technical University in Vienna, the Austrian Society for Analytical Chemistry and Microchemistry, the German Metals Society (DGM), and the Society of German Iron and Steel Engineers (VDEh) - was attended by 120 scientists from 12 nations. The major topics covered were surface, micro and trace analysis of materials with a heavy emphasis on metals. According to the strategy of the meeting attention was focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and tech nology. Therefore progress reports on analytical technique...
Handbook of Microscopy
Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"
Electron Microscopy
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
Plastics Additives
"Cover-to-cover reading of Plastics Additives, Advanced Industrial Analysis, is recommended for both professional analysts and plastics technologists. Professor Bart’s prose style is easy to read. A professional background in analytical chemistry is not assumed. Particularly valuable is the trove of good advice as to which approach might be best in a given situation. Every department with a serious interest in additive / property relations should invest in a copy.” -- PMAD Newsletter. This industrially relevant and up-to-date resource deals with all established and emerging analytical methods for in-polymer additive analysis of plastics formulations. Quality assurance and industrial trou...
Advances in Solar Energy
Advances in Solar Energy is back on schedule. Volume III contains a number of interesting reviews of the different fields in solar energy conversion. We appreciate the many encouraging comments received after the second volume appeared and have incorporated some of the suggested changes. Even though most of the reviews are invited through our editors, we are always open to suggestion about subjects of importance that are ready for a com prehensive and critical review and have not been recently covered, or about potential authors. I would like to take this opportunity to thank Professor John A. Duffie for his invaluable help in starting the Advances in Solar Energy series. Although he has rec...
Handbook of Surface and Interface Analysis
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear
