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Reflection High-Energy Electron Diffraction
  • Language: en
  • Pages: 370

Reflection High-Energy Electron Diffraction

Publisher Description

Molecular Beam Epitaxy
  • Language: en
  • Pages: 529

Molecular Beam Epitaxy

  • Type: Book
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  • Published: 2015
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  • Publisher: Unknown

The book is a history of Molecular Beam Epitaxy (MBE) as applied to the growth of semiconductor thin films (note that it does not cover the subject of metal thin films). It begins by examining the origins of MBE, first of all looking at the nature of molecular beams and considering their application to fundamental physics, to the development of nuclear magnetic resonance and to the invention of the microwave MASER. It shows how molecular beams of silane (SiH4) were used to study the nucleation of silicon films on a silicon substrate and how such studies were extended to compound semiconductors such as GaAs. From such surface studies in ultra-high vacuum the technique developed into a method ...

Holography
  • Language: en
  • Pages: 700

Holography

What Is Holography Holography is a technique that enables a wavefront to be recorded and later re-constructed. Holography is best known as a method of generating three-dimensional images, but it also has a wide range of other applications. In principle, it is possible to make a hologram for any type of wave. How You Will Benefit (I) Insights, and validations about the following topics: Chapter 1: Holography Chapter 2: Diffraction Chapter 3: Microscopy Chapter 4: Interferometry Chapter 5: Photorefractive effect Chapter 6: Particle image velocimetry Chapter 7: Holographic data storage Chapter 8: Interference lithography Chapter 9: Rainbow hologram Chapter 10: Holographic interferometry Chapter...

Groups IV, V, and VI Transition Metals and Compounds
  • Language: en
  • Pages: 219

Groups IV, V, and VI Transition Metals and Compounds

responsibility.) To Betty Edwards and Emily Copenhaver my thanks for what must have seemed endless typing, retyping and correcting of these bibliographies over a span of years. Availability of Documents U. S. Government contractor reports, usually identified by an alpha-numeric report number, can be purchased from National Technical Information Service U. S. Department of Commerce Springfield, Virginia 22151 and, often, on request from the issuing installation. USAEC reports are also available from International Atomic Energy Agency Kaerntnerring A 1010 Vienna, Austria National Lending Library Boston Spa England Monographs and reports of the National Bureau of Standards are for sale by Super...

JJAP
  • Language: en
  • Pages: 410

JJAP

  • Type: Book
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  • Published: 1998
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  • Publisher: Unknown

None

Japanese Journal of Applied Physics
  • Language: en
  • Pages: 880

Japanese Journal of Applied Physics

  • Type: Book
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  • Published: 1995
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  • Publisher: Unknown

None

JJAP Letters
  • Language: en
  • Pages: 582

JJAP Letters

  • Type: Book
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  • Published: 2002
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  • Publisher: Unknown

None

Journal of the Physical Society of Japan
  • Language: en
  • Pages: 1418

Journal of the Physical Society of Japan

  • Type: Book
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  • Published: 1989
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  • Publisher: Unknown

None

RHEED Transmission Mode and Pole Figures
  • Language: en
  • Pages: 231

RHEED Transmission Mode and Pole Figures

This unique book covers the fundamental principle of electron diffraction, basic instrumentation of RHEED, definitions of textures in thin films and nanostructures, mechanisms and control of texture formation, and examples of RHEED transmission mode measurements of texture and texture evolution of thin films and nanostructures. Also presented is a new application of RHEED in the transmission mode called RHEED pole figure technique that can be used to monitor the texture evolution in thin film growth and nanostructures and is not limited to single crystal epitaxial film growth. Details of the construction of RHEED pole figures and the interpretation of observed pole figures are presented. Mat...

Advances in Surface and Thin Film Diffraction: Volume 208
  • Language: en
  • Pages: 408

Advances in Surface and Thin Film Diffraction: Volume 208

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.