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Simulated Evolution and Learning
This volume constitutes the proceedings of the 7th International Conference on Simulated Evolution and Learning, SEAL 2008, held in Melbourne, Australia, during December 7-10, 2008. The 65 papers presented were carefully reviewed and selected from 140 submissions. The topics covered are evolutionary learning; evolutionary optimisation; hybrid learning; adaptive systems; theoretical issues in evolutionary computation; and real-world applications of evolutionary computation techniques.
Handbook of Optical Constants of Solids
While bits and pieces of the index of refraction n and extinction coefficient k for a given material can be found in several handbooks, the Handbook of Optical Constants of Solids gives for the first time a single set of n and k values over the broadest spectral range (ideally from x-ray to mm-wave region). The critiquers have chosen the numbers for you, based on their own broad experience in the study of optical properties. Whether you need one number at one wavelength or many numbers at many wavelengths, what is available in the literature is condensed down into a single set of numbers. - Contributors have decided the best values for n and k - References in each critique allow the reader t...
Production Metrology
This work presents the systematics of production metrology starting from the inspection planning, across the recording of the inspected data up to the evaluation of this data. On the one hand, the reader will be supplied with basic knowledge for the understanding of the presented procedures and their practical use. On the other hand, he will also learn about the importance of production metrology for quality control in production processes. It is not only an indispensable reference book for the daily work of the engineer, but also a invaluable and easy to read text book for students. As a supplement for the studies, the book gives a fast overlook to the basics of production metrology and, at the same time, shows how this knowledge is put into practice.
Handbook of Semiconductor Manufacturing Technology
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five enti...
Learning Classifier Systems
This book constitutes the thoroughly refereed joint post-conference proceedings of two consecutive International Workshops on Learning Classifier Systems that took place in Seattle, WA, USA in July 2006, and in London, UK, in July 2007 - all hosted by the Genetic and Evolutionary Computation Conference, GECCO. The 14 revised full papers presented were carefully reviewed and selected from the workshop contributions. The papers are organized in topical sections on knowledge representation, analysis of the system, mechanisms, new directions, as well as applications.
Computational Intelligence
This book includes a selection of revised and extended versions of the best papers from the seventh International Joint Conference on Computational Intelligence (IJCCI 2015), held in Lisbon, Portugal, from 12 to 14 November 2015, which was composed of three co-located conferences: The International Conference on Evolutionary Computation Theory and Applications (ECTA), the International Conference on Fuzzy Computation Theory and Applications (FCTA), and the International Conference on Neural Computation Theory and Applications (NCTA). The book presents recent advances in scientific developments and applications in these three areas, reflecting the IJCCI’s commitment to high quality standards.
