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ToF-SIMS
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Surface Analysis
This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.
Secondary Ion Mass Spectrometry
This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Photoelectron Spectroscopy
Photoelectron Spectroscopy presents an up-to-date introduction to the field by comprehensively treating the electronic structures of atoms, molecules, solids, and surfaces. Brief descriptions are given of inverse photoemission, spin-polarized photoemission and photoelectron diffraction. Experimental aspects are considered throughout the book and the results are carefully interpreted in terms of the theory. A wealth of measured data is presented in tabulator form for easy use by experimentalists.
Business in Black and White
Business in Black and White provides a panoramic discussion of various initiatives that American presidents have supported to promote black business development in the United States. Many assume that U.S. government interest in promoting black entrepreneurship began with Richard Nixon's establishment of the Office of Minority Business Enterprise (OMBE) in 1969. Drawn from a variety of sources, Robert E. Weems, Jr.'s comprehensive work extends the chronology back to the Coolidge Administration with a compelling discussion of the Commerce Departmen's “Division of Negro Affairs.” Weems deftly illustrates how every administration since Coolidge has addressed the subject of black business dev...
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Tailoring Surfaces
The focus of the book is the modification of surfaces to tailor them for a specific purpose. Using this method of surface modification, materials chosen for their bulk properties (tensile strength, temperature stability, density, price can be optimized for any particular application, which can lead to improved hardness, biological inertness or activity, corrosion resistance, low or high friction or adhesion, water repellency or wettability, or catalytic activity. The works of the author — many of his crucial papers are included — touches upon these surface properties and spans fields including catalysis, analytical surface science, self-assembled monolayers, tribology, biomaterials, superhydrophobicity and polymer coatings.
An Introduction to Surface Analysis by XPS and AES
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it ...
