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The aim of this text is to present the background, the important concepts, and tabulated data of Auger electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS) in a practical context for those involved in applied surface analysis techniques.
Volume One of this set is an updated manual covering the theory and practice of X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) techniques for surface analysis. The text takes into account improvements in equipment, experimental procedures and data interpretation over the last few years.
Contains an outline of the principles and characteristics of relevant instrumental techniques, provides an overview of various aspects of direct additive analysis by focusing on an array of applications in R ampD, production, quality control, and technical service.