Welcome to our book review site go-pdf.online!

You may have to Search all our reviewed books and magazines, click the sign up button below to create a free account.

Sign up

Electron Energy Loss Spectroscopy
  • Language: en
  • Pages: 245

Electron Energy Loss Spectroscopy

Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.

Nanocharacterisation
  • Language: en
  • Pages: 375

Nanocharacterisation

Nanocharacterisation provides an overview of the main characterisation techniques that are currently used to study nanostructured materials. Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods. With contributions from internationally recognised experts, each chapter focuses on a different technique to characterise nanomaterials providing experimental procedures and applications. State of the art characterisation methods covered include Transmission Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handbook to all working in the field this indispensable resource will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.

Electron Microscopy and Analysis 2001
  • Language: en
  • Pages: 562

Electron Microscopy and Analysis 2001

  • Type: Book
  • -
  • Published: 2001-12-01
  • -
  • Publisher: CRC Press

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.

Turning Points in Solid-state, Materials and Surface State
  • Language: en
  • Pages: 946

Turning Points in Solid-state, Materials and Surface State

The scientific exploration of solid materials represents one of the most important, fascinating and rewarding areas of scientific endeavour in the present day, not only from the viewpoint of advancing fundamental understanding but also from the industrial perspective, given the immense diversity of applications of solid materials across the full range of commercial sectors. Turning Points in Solid-State, Materials and Surface Science provides a state-of-the-art survey of some of the most important recent developments across the spectrum of solid-state, materials and surface sciences, while at the same time reflecting on key turning points in the evolution of this scientific discipline and pr...

Nanocharacterisation
  • Language: en
  • Pages: 319

Nanocharacterisation

Nanocharacterisation is a rapidly developing field. Contributions in this book from across the globe provide an overview of the different microscopic techniques for the characterisation of nanostructures.

Energy-Filtering Transmission Electron Microscopy
  • Language: en
  • Pages: 435

Energy-Filtering Transmission Electron Microscopy

  • Type: Book
  • -
  • Published: 2013-06-29
  • -
  • Publisher: Springer

Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imgaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes EELS, ESI, ESD and REM.

Electron Microscopy and Analysis 2003
  • Language: en
  • Pages: 520

Electron Microscopy and Analysis 2003

  • Type: Book
  • -
  • Published: 2004-02-19
  • -
  • Publisher: CRC Press

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial

Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas
  • Language: en
  • Pages: 472

Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas

This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.

Brydson's Plastics Materials
  • Language: en
  • Pages: 894

Brydson's Plastics Materials

Brydson's Plastics Materials, Eighth Edition, provides a comprehensive overview of the commercially available plastics materials that bridge the gap between theory and practice. The book enables scientists to understand the commercial implications of their work and provides engineers with essential theory. Since the previous edition, many developments have taken place in plastics materials, such as the growth in the commercial use of sustainable bioplastics, so this book brings the user fully up-to-date with the latest materials, references, units, and figures that have all been thoroughly updated. The book remains the authoritiative resource for engineers, suppliers, researchers, materials ...

Electron Microscopy and Analysis 1999
  • Language: en
  • Pages: 1320

Electron Microscopy and Analysis 1999

  • Type: Book
  • -
  • Published: 1999-12-01
  • -
  • Publisher: CRC Press

Electron Microscopy and Analysis 1999 provides an overview of recent developments and outlines opportunities for future research in electron microscopy. The book presents the wide-ranging applications of these techniques in materials science, metallurgy, and surface science. It is an authoritative reference for academics and researchers working in materials science, instrumentation, electron optics, and condensed matter physics.