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Design for Manufacturability and Statistical Design
Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.
Design for Manufacturability and Yield for Nano-Scale CMOS
This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.
CMOS Biotechnology
Lately, there has been a growing interest in exploiting the benefits of the ICs for areas outside of the traditional application spaces. One noteable area is found in biology Bioanalytical instruments have been miniaturized on ICs to study various biophenomena or to actuate biosystems. These biolab-on-IC systems utilize the IC to facilitate faster, repeatable, and standardized biological experiments at low cost with a small volume of biological sample. The research activities in this field are expected to enjoy substantial growth in the foreseeable future. BioCMOS Technologies reviews these exciting recent efforts in joining CMOS technology with biology.
SAT-Based Scalable Formal Verification Solutions
This book provides an engineering insight into how to provide a scalable and robust verification solution with ever increasing design complexity and sizes. It describes SAT-based model checking approaches and gives engineering details on what makes model checking practical. The book brings together the various SAT-based scalable emerging technologies and techniques covered can be synergistically combined into a scalable solution.
Low Power Methodology Manual
This book provides a practical guide for engineers doing low power System-on-Chip (SoC) designs. It covers various aspects of low power design from architectural issues and design techniques to circuit design of power gating switches. In addition to providing a theoretical basis for these techniques, the book addresses the practical issues of implementing them in today's designs with today's tools.
Circadian Rhythms for Future Resilient Electronic Systems
This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT.
A Practical Introduction to PSL
This book describes the Property Specification Language PSL, recently standardized as IEEE Standard 1850-2005. PSL was developed to fulfill the following requirements: easy to learn, write, and read; concise syntax; rigorously well-defined formal semantics; expressive power, permitting the specification for a large class of real world design properties; known efficient underlying algorithms in simulation, as well as formal verification. Basic features are covered, as well as advanced topics such as the use of PSL in multiply-clocked designs. A full chapter is devoted to common errors, gathered through the authors' many years of experience in using and teaching the language.
Silicon Materials-Processing, Characterization and Reliability: Volume 716
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
