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Fault-Tolerance Techniques for SRAM-Based FPGAs
This book reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. Some of these are based on new fault-tolerant architecture, and others on protecting the high-level hardware description before synthesis in the FPGA. The text helps the reader choose the best techniques project-by-project, and to compare fault tolerant techniques for programmable logic applications.
Debug Automation from Pre-Silicon to Post-Silicon
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve...
Applied Reconfigurable Computing
This book constitutes the refereed proceedings of the 13th International Symposium on Applied Reconfigurable Computing, ARC 2017, held in Delft, The Netherlands, in April 2017. The 17 full papers and 11 short papers presented in this volume were carefully reviewed and selected from 49 submissions. They are organized in topical sections on adaptive architectures, embedded computing and security, simulation and synthesis, design space exploration, fault tolerance, FGPA-based designs, neural neworks, and languages and estimation techniques.
From Specification to Embedded Systems Application
IFIP TC10 Working Conference: Internationall Embedded Systems Symposium (IESS), August 15-17, 2005, Manaus, Brazil
Reconfigurable Computing: Architectures, Tools and Applications
This book constitutes the refereed proceedings of the Third International Workshop on Applied Reconfigurable Computing, ARC 2007, held in Mangaratiba, Brazil, in March 2007. The 27 full papers and 10 short papers presented together with a late-comer contribution from ARC 2006 are organized in topical sections on architectures, mapping techniques and tools, arithmetic, and applications.
Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation
This book constitutes the refereed proceedings of the 15th International Workshop on Power and Timing Optimization and Simulation, PATMOS 2005, held in Leuven, Belgium in September 2005. The 74 revised full papers presented were carefully reviewed and selected from numerous submissions. The papers are organized in topical sections on low-power processors, code optimization for low-power, high-level design, telecommunications and signal processing, low-power circuits, system-on-chip design, busses and interconnections, modeling, design automation, low-power techniques, memory and register files, applications, digital circuits, and analog and physical design.
Emerging Nanotechnologies
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
VLSI-SoC: From Algorithms to Circuits and System-on-Chip Design
This book contains extended and revised versions of the best papers presented at the 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2012, held in Santa Cruz, CA, USA, in October 2012. The 12 papers included in the book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems.
FPGAs and Parallel Architectures for Aerospace Applications
This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.
Radiation Effects on Embedded Systems
This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
