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High Purity and High Mobility Semiconductors 15
  • Language: en
  • Pages: 190

High Purity and High Mobility Semiconductors 15

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Silicon-On-Insulator (SOI) Technology
  • Language: en
  • Pages: 503

Silicon-On-Insulator (SOI) Technology

  • Type: Book
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  • Published: 2014-06-19
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  • Publisher: Elsevier

Silicon-On-Insulator (SOI) Technology: Manufacture and Applications covers SOI transistors and circuits, manufacture, and reliability. The book also looks at applications such as memory, power devices, and photonics. The book is divided into two parts; part one covers SOI materials and manufacture, while part two covers SOI devices and applications. The book begins with chapters that introduce techniques for manufacturing SOI wafer technology, the electrical properties of advanced SOI materials, and modeling short-channel SOI semiconductor transistors. Both partially depleted and fully depleted SOI technologies are considered. Chapters 6 and 7 concern junctionless and fin-on-oxide field effe...

Crystalline Defects and Contamination
  • Language: en
  • Pages: 380
High Purity Silicon 11
  • Language: en
  • Pages: 262

High Purity Silicon 11

The papers included in this issue of ECS Transactions were originally presented in the symposium ¿High Purity Silicon 11¿, held during the 218th meeting of The Electrochemical Society, in Las Vegas, Nevada from October 10 to 15, 2010.

Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 2009)
  • Language: en
  • Pages: 479

Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 2009)

The proceedings of ALTECH 2009 address recent developments and applications of analytical techniques for semiconductor materials, processes and devices. The papers comprise techniques of elemental and structural analysis for bulk and surface impurities and defects, thin films as well as dopants in ultra-shallow junctions.

Semiconductor Wafer Bonding 10: Science, Technology, and Applications
  • Language: en
  • Pages: 588

Semiconductor Wafer Bonding 10: Science, Technology, and Applications

This issue of ECS Transactions on Semiconductor Wafer Bonding will cover the state-of-the-art R&D results of the last 2 years in the field of semiconductor wafer bonding technology. Wafer Bonding is an Enabling Technology that can be used to create novel composite materials systems and devices that would otherwise be unattainable. Wafer Bonding today is rapidly expanding into new applications in such diverse fields as photonics, sensors, MEMS. X-ray optics, non-electronic microstructures, high performance CMOS platforms for high end servers, Si-Ge, strained SOI, Germanium-on-Insulator (GeOI) and Nanotechnologies.

Computational Materials, Chemistry, and Biochemistry: From Bold Initiatives to the Last Mile
  • Language: en
  • Pages: 1344

Computational Materials, Chemistry, and Biochemistry: From Bold Initiatives to the Last Mile

This book provides a broad and nuanced overview of the achievements and legacy of Professor William (“Bill”) Goddard in the field of computational materials and molecular science. Leading researchers from around the globe discuss Goddard’s work and its lasting impacts, which can be seen in today’s cutting-edge chemistry, materials science, and biology techniques. Each section of the book closes with an outline of the prospects for future developments. In the course of a career spanning more than 50 years, Goddard’s seminal work has led to dramatic advances in a diverse range of science and engineering fields. Presenting scientific essays and reflections by students, postdoctoral as...

Metal Impurities in Silicon- and Germanium-Based Technologies
  • Language: en
  • Pages: 464

Metal Impurities in Silicon- and Germanium-Based Technologies

  • Type: Book
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  • Published: 2018-08-13
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  • Publisher: Springer

This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

Fundamentals of Layout Design for Electronic Circuits
  • Language: en
  • Pages: 319

Fundamentals of Layout Design for Electronic Circuits

This book covers the fundamental knowledge of layout design from the ground up, addressing both physical design, as generally applied to digital circuits, and analog layout. Such knowledge provides the critical awareness and insights a layout designer must possess to convert a structural description produced during circuit design into the physical layout used for IC/PCB fabrication. The book introduces the technological know-how to transform silicon into functional devices, to understand the technology for which a layout is targeted (Chap. 2). Using this core technology knowledge as the foundation, subsequent chapters delve deeper into specific constraints and aspects of physical design, such as interfaces, design rules and libraries (Chap. 3), design flows and models (Chap. 4), design steps (Chap. 5), analog design specifics (Chap. 6), and finally reliability measures (Chap. 7). Besides serving as a textbook for engineering students, this book is a foundational reference for today’s circuit designers. For Slides and Other Information: https://www.ifte.de/books/pd/index.html