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Reliability, Yield, and Stress Burn-In
The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a ...
Design of Dependable Computing Systems
This book analyzes the causes of failures in computing systems, their consequences, as weIl as the existing solutions to manage them. The domain is tackled in a progressive and educational manner with two objectives: 1. The mastering of the basics of dependability domain at system level, that is to say independently ofthe technology used (hardware or software) and of the domain of application. 2. The understanding of the fundamental techniques available to prevent, to remove, to tolerate, and to forecast faults in hardware and software technologies. The first objective leads to the presentation of the general problem, the fault models and degradation mechanisms wh ich are at the origin of th...
China Semiconductor Technology International Conference 2010 (CSTIC 2010)
Our mission is to provide a forum for world experts to discuss technologies, address the growing needs associated with silicon technology, and exchange their discoveries and solutions for current issues of high interest. We encourage collaboration, open discussion, and critical reviews at this conference. Furthermore, we hope that this conference will also provide collaborative opportunities for those who are interested in the semiconductor industry in Asia, particularly in China.
ISTFA 2014
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
Advanced Reliability Modeling - Proceedings Of The 2004 Asian International Workshop (Aiwarm 2004)
The 2004 Asian International Workshop on Advanced Reliability Modeling is a symposium for the dissemination of state-of-the-art research and the presentation of practice in reliability engineering and related issues in Asia. It brings together researchers, scientists and practitioners from Asian countries to discuss the state of research and practice in dealing with reliability issues at the system design (modeling) level, and to jointly formulate an agenda for future research in this engineering area. The proceedings cover all the key topics in reliability, maintainability and safety engineering, providing an in-depth presentation of theory and practice.The proceedings have been selected for coverage in:• Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)• Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)• CC Proceedings — Engineering & Physical Sciences
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