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Advanced Transmission Electron Microscopy
  • Language: en
  • Pages: 741

Advanced Transmission Electron Microscopy

  • Type: Book
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  • Published: 2016-10-26
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  • Publisher: Springer

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Electron Microdiffraction
  • Language: en
  • Pages: 374

Electron Microdiffraction

Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted from a visit to the National Science Foundation's Electron Microscopy Facility at Arizona State Universi...

Quantitative Convergent Beam Electron Diffraction and Its Applications in Studying Crystal Structure and Bonding
  • Language: en
  • Pages: 488
Common mistakes in English
  • Language: zh-CN
  • Pages: 293

Common mistakes in English

  • Type: Book
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  • Published: 1982
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  • Publisher: Unknown

None

Scanning Transmission Electron Microscopy
  • Language: en
  • Pages: 764

Scanning Transmission Electron Microscopy

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Springer Handbook of Microscopy
  • Language: en
  • Pages: 1561

Springer Handbook of Microscopy

This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical micr...

Applications of Physical Methods to Inorganic and Bioinorganic Chemistry
  • Language: en
  • Pages: 597

Applications of Physical Methods to Inorganic and Bioinorganic Chemistry

Modern spectroscopic and instrumental techniques are essential to the practice of inorganic and bioinorganic chemistry. This first volume in the new Wiley Encyclopedia of Inorganic Chemistry Methods and Applications Series provides a consistent and comprehensive description of the practical applicability of a large number of techniques to modern problems in inorganic and bioinorganic chemistry. The outcome is a text that provides invaluable guidance and advice for inorganic and bioinorganic chemists to select appropriate techniques, whilst acting as a source to the understanding of these methods. This volume is also available as part of Encyclopedia of Inorganic Chemistry, 5 Volume Set. This set combines all volumes published as EIC Books from 2007 to 2010, representing areas of key developments in the field of inorganic chemistry published in the Encyclopedia of Inorganic Chemistry. Find out more.

Advanced Computing in Electron Microscopy
  • Language: en
  • Pages: 357

Advanced Computing in Electron Microscopy

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

Handbook of Microscopy for Nanotechnology
  • Language: en
  • Pages: 745

Handbook of Microscopy for Nanotechnology

Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scann...

Structure and Properties of Lengthy Rails after Extreme Long-Term Operation
  • Language: en
  • Pages: 192

Structure and Properties of Lengthy Rails after Extreme Long-Term Operation

The long-term operation of rails has been studied with focus on (1) the formation and behavior of structural-phase states and nanoscale structures, (2) the modelling of the processes occurring in the surface layers of rails under severe plastic deformation and (3) the methods and techniques for assessing the structural and phase states of rails, internal stresses, and their evolution during the life cycle. The book references 264 original resources and includes their direct web link for in-depth reading. Keywords: Long Rails, Long-term Operation, Transmission Electron Microscopy, Steel, Differentiated Hardening, Structural Phase States, Nanoscale Structures, Wear, Deformation Effects, Recrystallization, Segregation, Homogenization, Relaxation, Phase Transitions, Phase Decomposition, Amorphization, Sintering, Filling of Micro- and Nanopores, Nanocapillaries, Severe Plastic Deformation, Megaplastic Deformation.