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Ultrafast Phenomena XIV
Ultrafast Phenomena XIV presents the latest advances in ultrafast science, including ultrafast laser and measurement technology as well as studies of ultrafast phenomena. Pico-, femto-, and atosecond processes relevant in physics, chemistry, biology and engineering are presented. Ultrafast technology is now having a profound impact within a wide range of applications, among them imaging, material diagnostics, and transformation and high-speed optoelectronics. This book summarizes results presented at the 14th Ultrafast Phenomena Conference and reviews the state of the art in this important and rapidly advancing field.
Photochemistry
The breadth of scientific and technological interests in the general topic of photochemistry is truly enormous and includes, for example, such diverse areas as microelectronics, atmospheric chemistry, organic synthesis, non-conventional photoimaging, photosynthesis, solar energy conversion, polymer technologies, and spectroscopy. This Specialist Periodical Report on Photochemistry aims to provide an annual review of photo-induced processes that have relevance to the above wide-ranging academic and commercial disciplines, and interests in chemistry, physics, biology and technology. In order to provide easy access to this vast and varied literature, each volume of Photochemistry comprises sect...
Femtosecond Laser Pulses
This smooth introduction for advanced undergraduates starts with the fundamentals of lasers and pulsed optics. Thus prepared, the student is introduced to short and ultrashort laser pulses, and learns how to generate, manipulate, and measure them. Spectroscopic implications are also discussed. The second edition has been completely revised and includes two new chapters on some of the most promising and fast-developing applications in ultrafast phenomena: coherent control and attosecond pulses.
Laser Spectroscopy
Keeping abreast of the latest techniques and applications, this new edition of the standard reference and graduate text on laser spectroscopy has been completely revised and expanded. While the general concept is unchanged, the new edition features a broad array of new material, e.g., frequency doubling in external cavities, reliable cw-parametric oscillators, tunable narrow-band UV sources, more sensitive detection techniques, tunable femtosecond and sub-femtosecond lasers (X-ray region and the attosecond range), control of atomic and molecular excitations, frequency combs able to synchronize independent femtosecond lasers, coherent matter waves, and still more applications in chemical analysis, medical diagnostics, and engineering.
Lasers and Applications
The International Conference on Lasers and Applications was held in Rio de Janeiro, Brazil from 29 June to 3 July 1980. This conference was held to commemorate the memory of Professor Sergio Porto who died suddenly about one year earlier while attending a laser conference in the Soviet Union. The sub ject matter covered the active areas of laser devices, photochemistry, non linear optics, high-resolution spectroscopy, photokinetics, photobiology, photomedicine, optical communication, optical bistability, and Raman spec troscopy. The conference was attended by over 150 people including scientists from Japan, France, England, West Germany, Norway, Italy, Brazil, Chile, Argentina, India, Canada...
Laser Processing and Diagnostics
Laser processing is now a rapidly increasing field with many real and potential applications in different areas of technology such as micromecha nics, metallurgy, integrated optics, and semiconductor device fabrication. The neces s ity for such soph i st i cated 1 i ght sources as 1 asers is based on the spatial coherence and the monochromaticity of laser light. The spatial coherence permits extreme focussing of the laser light resulting in the availability of high energy densities which can be used for strongly loca lized heat- and chemical-treatment of materials, with a resolution down to 1 ess than 1 lJIll. When us i ng pul sed or scanned cw-l asers, 1 oca 1 i zat i on in time is also pos...
ToF-SIMS
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
X-Ray Free Electron Lasers
Edited by pioneers in this exciting field, and featuring contributions from leading researchers, this book discusses the principles and applications of XFELs.
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