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Semiconductors, Dielectrics, and Metals for Nanoelectronics 13
  • Language: en
  • Pages: 386
SiGe and Ge
  • Language: en
  • Pages: 1280

SiGe and Ge

The second International SiGe & Ge: Materials, Processing, and Devices Symposium was part of the 2006 ECS conference held in Cancun, Mexico from October 29-Nov 3, 2006. This meeting provided a forum for reviewing and discussing all materials and device related aspects of SiGe & Ge. The hardcover edition includes a bonus CD-ROM containing the PDF of the entire issue.

Nanocomposite Thin Films and Coatings
  • Language: en
  • Pages: 628

Nanocomposite Thin Films and Coatings

Emcompasses three major parts of the development of nanocomposite films and coatings: processing and properties; mechanical performance; functional performance; and includes wide application areas ranging from mechanical cutting to solar energy and from electronics to medicine.

Advanced Gate Stack, Source/drain and Channel Engineering for Si-based CMOS
  • Language: en
  • Pages: 658

Advanced Gate Stack, Source/drain and Channel Engineering for Si-based CMOS

  • Type: Book
  • -
  • Published: 2005
  • -
  • Publisher: Unknown

None

Structural Integrity Considerations In. .
  • Language: en
  • Pages: 628

Structural Integrity Considerations In. .

This book deals with the concepts of structural integrity from safe life to damage tolerance to holistic structural integrity processes, which are all part of a reliability-centered closed loop design approach. Volume 1 introduces the concepts of structural integrity and the basics of fatigue design, including the development of safe life fatigue design concepts based on traditional continuum mechanics. An extensive discussion of discontinuities is presented to illustrate their importance to all deformation mechanisms and especially the mechanisms of fatigue. The historical aspects of fatigue design are also introduced with emphasis on the stress-life and strain-life approaches, along with the many factors that affect fatigue life of structures and their utilization in society. Latter chapters of the book briefly discuss the extraneous effects on fatigue such as corrosion, fretting, wear, creep, and accidental damage. These will be dealt with in more detail in latter volumes. Finally, the book gives many examples of fatigue failures that have occurred in history and cites ways these could have been prevented and the lessons learned from such fatigue failures.

Physics and Technology of High-k Materials 8
  • Language: en
  • Pages: 621

Physics and Technology of High-k Materials 8

The issue of ECS Transactions will cover comprehensively all the aspects of high-k material physics and technology: Diverse High Mobility Substrates, High-k Materials, Metal Gate Electrode Materials, Deposition Techniques, Bulk Material Properties, Flat-Band Voltage Issues and Control, Interfaces, Gate Stack Reliability, Electrical, Chemical, and Physical Chatracterization, Novel Applications, High-k and Diverse Insulators for Photonics, High-k Processing/ Manufacturing.